Low

TPS2552DBVT - 

Power Distribution Switch, Current Limiting, High Side, Active Low, 1 Output, 6.5V, 1.5A, SOT-23-6

TEXAS INSTRUMENTS TPS2552DBVT

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Artikelnr. fabrikant:
TPS2552DBVT
Ordercode:
2437580

Productgegevens

:
Yes
:
1.5A
:
Active Low
:
-40°C
:
1Outputs
:
85°C
:
6Pins
:
SOT-23
:
6.5V
:
-
:
-
:
High Side
:
Tape & Reel
:
0.085ohm
:
MSL 1 - Unlimited
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Productoverzicht

The TPS2552DBVT is an Adjustable Active Low Current-limited Power Distribution Switch intended for applications where precision current limiting is required or heavy capacitive loads and short-circuits are encountered and provide up to 1.5A of continuous load current. This constant current device offers a programmable current-limit threshold between 75mA and 1.7A (typical) via an external resistor. Current-limit accuracy as tight as ±6% can be achieved at the higher current-limit settings. The power-switch rise and fall times are controlled to minimize current surges during turn on/off. TPS2552 device limit the output current to a safe level by using a constant-current mode when the output load exceeds the current-limit threshold. An internal reverse-voltage comparator disables the power-switch when the output voltage is driven higher than the input to protect devices on the input side of the switch. The FAULT output asserts low during over-current and reverse-voltage conditions.
  • Up to 1.5A maximum load current
  • ±6% Current-limit accuracy at 1.7A
  • Meets USB current-limiting requirements
  • Backwards compatible with TPS2550/51
  • 75 to 1300mA Adjustable current limit
  • Constant-current device
  • Fast over-current response (2µs typical)
  • 85mR High-side MOSFET
  • Reverse input-output voltage protection
  • 2.5 to 6.5V Operating range
  • Built-in soft start
  • Green product and no Sb/Br

Toepassingen

Communications & Networking, Multimedia, Consumer Electronics

Waarschuwingen

This IC can be damaged by ESD. We recommend that all ICs be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

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