REF6033IDGKT

The REF6033IDGKT from Texas Instruments is a high precision voltage reference with integrated ADC drive buffer in 8 pin VSSOP package. It has an integrated low output impedance buffer that enable user to directly drive REF pin of precision data converters while preserving linearity, distortion and noise performance. Most precision SAR and delta-sigma ADCs, switch binary weighted capacitors on to REF pin during the conversion process. In order to support this dynamic load the output of voltage reference must be buffered with low output impedance (high bandwidth) buffer. It is able to maintain an output voltage within 1LSB (18bit) with minimal droop even during first conversion while driving the REF pin of ADS8881. This feature is useful in burst mode, event triggered, equivalent time sampling and variable sampling rate data acquisition systems. It is used in ATE testers, oscilloscopes, test and measurement equipment, analogue input modules for PLCs & precision data acquisition systems.

• Excellent temperature drift performance of 5ppm/°C (maximum) from -40°C to +125°C
• Output voltage of 3.3V and dropout voltage of 50mV at IL = 0mA & 600mV at IL = 4mA
• Supply input voltage (IOUT = 0mA) from 3.55V to 5.5V and output current drive of ±4mA
• Verified to drive REF pin of ADS88xx family of SAR ADCs and ADS127xx family of Wideband ΔΣADCs
• Low supply current of 820μA and low shutdown current of 1μA
• High initial accuracy of ±0.05% and very low noise and distortion
• Extremely low noise of 5μVrms with 47μF capacitor (total noise) & 3μVPP/V (1/f noise (0.1 to 10Hz))
• Programmable short circuit current, output impedance of 50mohm at f = DC to 200KHz, CL= 47μF
• Integrated ADC drive buffer, low output impedance is less than 50mohm (0-200KHz)
• Operating temperature range from -40°C to 125°C

Toepassingen

Power Management, Medical

Waarschuwingen

This integrated circuit can be damaged by ESD. The integrated circuit can be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.